Massively parallel confocal dark field microscopy
- A new technique which combines the advantages of darkfield microscopy with those of confocal microscopy has been developed. The Massively Parallel Confocal darkfield method implemented on a DMD-based confocal platform allows for detection of non-fluorescing particles with dimensions below the diffraction limit. The lateral resolution and depth discrimination of three dimensional objects are improved relative to conventional darkfield microscopy.
| Author: | James S. Napier, Markus Schellenberg, Gerhard Kauer, Walter Neu |
|---|---|
| DOI: | https://doi.org/10.1117/12.2649843 |
| Parent Title (English): | Proceedings Vol. 12435 SPIE OPTO, Emerging Digital Micromirror Device Based Systems and Applications XV, 28.01.-03.02.2023, San Francisco (California, United States) |
| Publisher: | SPIE |
| Editor: | Benjamin L. Lee, John Ehmke |
| Document Type: | Conference Proceeding |
| Language: | English |
| Year of Completion: | 2023 |
| Release Date: | 2025/03/12 |
| Article Number: | 5 |
| Institute: | Fachbereich Technik |
| Research Focus Area: | Nachhaltige Technologien und Prozesse |